"ESD event simulation automation using automatic extraction of the relevant ..."

Thorsten Weyl et al. (2009)

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DOI: 10.1109/ISQED.2009.4810330

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Thorsten Weyl, Dave Clarke, Karl Rinne, James A. Power:
ESD event simulation automation using automatic extraction of the relevant portion of a full chip. ISQED 2009: 414-418

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