"HiSIM-RP: A reverse-profiling based 1st principles compact ..."

Hironori Sakamoto et al. (2012)

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DOI: 10.1109/ISQED.2012.6187548

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Hironori Sakamoto, Shigetaka Kumashiro, Shigeo Sato, Naoki Wakita, Tohru Mogami:
HiSIM-RP: A reverse-profiling based 1^st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS. ISQED 2012: 553-560

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