"Simulating and Improving Microelectronic Device Reliability by Scaling ..."

Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein (2005)

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DOI: 10.1109/ISQED.2005.110

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein:
Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. ISQED 2005: 496-502

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