"A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm ..."

Choongyeun Cho et al. (2007)

> Home

Details and statistics

DOI: 10.1109/ISQED.2007.8

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/isqed/ChoKKPLCT07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isqed/ChoKKPLCT07
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Olivier Plouchart, Daihyun Lim, Sangyeun Cho, Robert Trzcinski:
A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology. ISQED 2007: 699-702

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.