"Effect of NDD dosage on hot-carrier reliability in DMOS transistors."

Jone F. Chen et al. (2009)

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DOI: 10.1109/ISQED.2009.4810298

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/isqed/ChenTCWL09
Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen, Kuo-Ming Wu, C. M. Liu:
Effect of NDD dosage on hot-carrier reliability in DMOS transistors. ISQED 2009: 226-229

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