"Overview of Reliability Issues in Deep Sub-Micron Digital CMOS Technology ..."

Mohsen Alavi (2003)

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type: Conference or Workshop Paper

metadata version: 2015-03-05

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Mohsen Alavi:
Overview of Reliability Issues in Deep Sub-Micron Digital CMOS Technology and Their Interaction with Circuit Design Considerations. ISQED 2003: 12

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