"A pattern matching algorithm for verification and analysis of very large ..."

Mariusz Niewczas, Wojciech Maly, Andrzej J. Strojwas (1998)

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DOI: 10.1145/274535.274554

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Mariusz Niewczas, Wojciech Maly, Andrzej J. Strojwas:
A pattern matching algorithm for verification and analysis of very large IC layouts. ISPD 1998: 129-134

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