"Crosstalk and Gate Oxide Reliability Analysis in Graphene Nanoribbon ..."

Debaprasad Das, Hafizur Rahaman (2011)

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DOI: 10.1109/ISED.2011.54

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Debaprasad Das, Hafizur Rahaman:
Crosstalk and Gate Oxide Reliability Analysis in Graphene Nanoribbon Interconnects. ISED 2011: 182-187

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