"Specimen Thickness and Tilt Offset Determination for Cryo-Electron ..."

Ranhao Zhang et al. (2025)

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DOI: 10.1109/ISBI60581.2025.10980856

access: closed

type: Conference or Workshop Paper

metadata version: 2025-12-07

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Ranhao Zhang, Mingtao Huang, Tianyuan Li, Xueming Li, Yuan Shen:
Specimen Thickness and Tilt Offset Determination for Cryo-Electron Tomography from a Hypothesis Testing and Optimization Perspective. ISBI 2025: 1-4

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