"Cycling Induced Trap Generation and Recovery Near the Top Select Gate ..."

Xingqi Zou et al. (2019)

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DOI: 10.1109/IRPS.2019.8720607

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-25

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Xingqi Zou, Liang Yan, Lei Jin, Da Li, Feng Xu, Di Ai, An Zhang, Hongtao Liu, Ming Wang, Wei Li, Yali Song, Huazheng Wei, Yi Chen, Chunlong Li, Zongliang Huo:
Cycling Induced Trap Generation and Recovery Near the Top Select Gate Transistor in 3D NAND. IRPS 2019: 1-5

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