"Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs ..."

Lyuan Xu et al. (2019)

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DOI: 10.1109/IRPS.2019.8720514

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-21

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Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill:
Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology. IRPS 2019: 1-5

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