"Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node."

Lyuan Xu et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128360

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-21

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Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva:
Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. IRPS 2020: 1-5

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