"Physics-based device aging modelling framework for accurate circuit ..."

Zhicheng Wu et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405106

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Zhicheng Wu, Jacopo Franco, Brecht Truijen, Philippe Roussel, Stanislav Tyaginov, Michiel Vandemaele, Erik Bury, Guido Groeseneken, Dimitri Linten, Ben Kaczer:
Physics-based device aging modelling framework for accurate circuit reliability assessment. IRPS 2021: 1-6

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