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"Conduction and Breakdown Mechanisms in Low-k Spacer and Nitride Spacer ..."
Chen Wu et al. (2020)
- Chen Wu, Adrian Vaisman Chasin, Steven Demuynck, Naoto Horiguchi, Kris Croes

:
Conduction and Breakdown Mechanisms in Low-k Spacer and Nitride Spacer Dielectric Stacks in Middle of Line Interconnects. IRPS 2020: 1-6

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