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"A common hard-failure mechanism in GaN HEMTs in accelerated switching and ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

D. Wieland et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117943

access: closed

type: Conference or Workshop Paper

metadata version: 2025-11-23

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  dblp key:
  - conf/irps/WielandOSBKSMRHNGPO23
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  persistent URL:
  - https://dblp.org/rec/conf/irps/WielandOSBKSMRHNGPO23
D. Wieland, Sybille Ofner, Manuel Stabentheiner, Boris Butej, Christian Koller, J. Sun, Andrea Minetto, Korbinian Reiser, Oliver Häberlen, Michael Nelhiebel, Michael Glavanovics, Dionyz Pogany, Clemens Ostermaier:
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests. IRPS 2023: 1-6

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