"The properties, effect and extraction of localized defect profiles from ..."

Michiel Vandemaele et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405164

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Michiel Vandemaele, Ben Kaczer, Stanislav Tyaginov, Jacopo Franco, Robin Degraeve, Adrian Vaisman Chasin, Zhicheng Wu, Erik Bury, Yang Xiang, Hans Mertens, Guido Groeseneken:
The properties, effect and extraction of localized defect profiles from degraded FET characteristics. IRPS 2021: 1-7

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