"SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and ..."

Taiki Uemura et al. (2019)

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DOI: 10.1109/IRPS.2019.8720513

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Seungbae Lee, Sangwoo Pae:
SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET. IRPS 2019: 1-6

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