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"HTGB and DGS Reliability Assessment of e-mode GaN-HEMTs with Ferroelectric ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Andrea Natale Tallarico et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983138

access: closed

type: Conference or Workshop Paper

metadata version: 2025-11-23

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Andrea Natale Tallarico, Maurizio Millesimo, U. Ibrar, Enrico Sangiorgi, Claudio Fiegna, T.-Y. Yang, J.-S. Wu, H. Iwai, E.-Y. Chang:
HTGB and DGS Reliability Assessment of e-mode GaN-HEMTs with Ferroelectric Gate Stack. IRPS 2025: 1-6

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