"Application-based Modeling of I/O Reliability."

M. D. Shroff et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983302

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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M. D. Shroff, J. Satasia, C. Lu, K. Xie, Z. Y. Liu, L. Zhang, R. Peng, J. Jiang, W. Zhao, G. Liu, R. Pavlanin, S. Kala-Janssen, R. Ye, H. Sanchez, D. Bearden, C. Le Cam, A. Patel, C. Magnella, C. Richards-Chacon:
Application-based Modeling of I/O Reliability. IRPS 2025: 1-6

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