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"Enhanced DRAM Single Bit Characteristics from Process Control of Chlorine."
Taiuk Rim et al. (2023)
- Taiuk Rim, Kyosuk Che, Sehyun Kwon, Jin-Seong Lee, Jeonghoon Oh, Hyodong Ban, Jooyoung Lee:

Enhanced DRAM Single Bit Characteristics from Process Control of Chlorine. IRPS 2023: 1-4

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