"Self-Heating and Process-Induced Threshold Voltage Aware Reliability and ..."

Sunil Rathore, Navjeet Bagga, S. Dasgupta (2024)

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DOI: 10.1109/IRPS48228.2024.10529473

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-03

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Sunil Rathore, Navjeet Bagga, S. Dasgupta:
Self-Heating and Process-Induced Threshold Voltage Aware Reliability and Aging Analysis of Forksheet FET. IRPS 2024: 65

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