"Impact of Electrical Defects located at Transistor Periphery on Analog and ..."

Luca Pirro et al. (2022)

> Home

Details and statistics

DOI: 10.1109/IRPS48227.2022.9764532

access: closed

type: Conference or Workshop Paper

metadata version: 2025-04-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/PirroLBKHZJEGOZ22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/PirroLBKHZJEGOZ22
Luca Pirro, P. Liebscher, C. Brantz, M. Kessler, H. Herzog, Olaf Zimmerhackl, R. Jain, E. Ebrand, K. Gebauer, Michael Otto, Alban Zaka, Jan Hoentschel:
Impact of Electrical Defects located at Transistor Periphery on Analog and RTN Device Performance. IRPS 2022: 59-1

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.