"Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an ..."

Nakul Pande et al. (2019)

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DOI: 10.1109/IRPS.2019.8720564

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy:
Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process. IRPS 2019: 1-6

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