"Investigation of the bipolar degradation of SiC MOSFET body diodes and the ..."

Shanmuganathan Palanisamy et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405183

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  - https://dblp.org/rec/conf/irps/PalanisamyBLKWE21
Shanmuganathan Palanisamy, Thomas Basler, Josef Lutz, Cesare Künzel, Larissa Wehrhahn-Kilian, Rudolf Elpelt:
Investigation of the bipolar degradation of SiC MOSFET body diodes and the influence of current density. IRPS 2021: 1-6

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