"Understanding and Variability of Lateral Charge Migration in 3D CT-NAND ..."

Andrea Padovani et al. (2019)

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DOI: 10.1109/IRPS.2019.8720566

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Andrea Padovani, Milan Pesic, Mondol Anik Kumar, Pieter Blomme, Alexandre Subirats, Senthil Vadakupudhupalayam, Zunaid Baten, Luca Larcher:
Understanding and Variability of Lateral Charge Migration in 3D CT-NAND Flash with and Without Band-Gap Engineered Barriers. IRPS 2019: 1-8

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