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"An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Sangmin Oh et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529338

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  dblp key:
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  - https://dblp.org/rec/conf/irps/OhJYLKJJSCJ24
Sangmin Oh, Taeyoung Jeong, Junghwan Yum, Minhyuk Lim, Yoohwan Kim, Bongyong Jeong, Jeongmin Jo, Hyewon Shim, Shin-Young Chung, Paul Jung:
An Analysis of CDM-induced BTI-like Degradation using VF-TLP in Advanced FinFET Technology. IRPS 2024: 1-5

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