Nicola Modolo, Andrea Minetto, Carlo De Santi, Luca Sayadi, Sebastien Sicre, Gerhard Prechtl, Gaudenzio Meneghesso, Enrico Zanoni, Matteo Meneghini: A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level. IRPS 2021: 1-5