"Evidence for temperature-dependent buffer-induced trapping in ..."

Matteo Meneghini et al. (2015)

> Home

Details and statistics

DOI: 10.1109/IRPS.2015.7112687

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/MeneghiniSDBZMV15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/MeneghiniSDBZMV15
Matteo Meneghini, Riccardo Silvestri, Stefano Dalcanale, Davide Bisi, Enrico Zanoni, Gaudenzio Meneghesso, Piet Vanmeerbeek, Abhishek Banerjee, Peter Moens:
Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon power transistors. IRPS 2015: 2

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.