"Effect of interface and bulk charges on the breakdown of nitrided gate ..."

Bruna Mazza et al. (2021)

> Home

Details and statistics

DOI: 10.1109/IRPS46558.2021.9405176

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/MazzaPCGRSZBF21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/MazzaPCGRSZBF21
Bruna Mazza, Salvatore Patané, Francesco Cordiano, Massimiliano Giliberto, Giovanni Renna, Andrea Severino, Edoardo Zanetti, Massimo Boscaglia, Giovanni Franco:
Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC. IRPS 2021: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.