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"Transient Leakage Current as a Non-destructive Probe of Wire-bond ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Md. Asaduz Zaman Mamun et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117658

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
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Md. Asaduz Zaman Mamun, Amar Mavinkurve, Michiel van Soestbergen, Muhammad Ashraful Alam:
Transient Leakage Current as a Non-destructive Probe of Wire-bond Electrochemical Failures. IRPS 2023: 1-7

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last updated on 2023-05-24 09:43 CEST by the dblp team

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