"Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs."

Alexander Makarov et al. (2019)

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DOI: 10.1109/IRPS.2019.8720584

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Alexander Makarov, Ben Kaczer, Philippe Roussel, Adrian Vaisman Chasin, Alexander Grill, Michiel Vandemaele, Geert Hellings, Al-Moatasem El-Sayed, Tibor Grasser, Dimitri Linten, Stanislav Tyaginov:
Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs. IRPS 2019: 1-7

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