"Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2."

Xiaolei Ma et al. (2019)

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DOI: 10.1109/IRPS.2019.8720537

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-02

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Xiaolei Ma, Xiangwei Jiang, Jiezhi Chen, Liwei Wang, Yunfei En:
Scaling Behaviour of State-to-State Coupling During Hole Trapping at Si/SiO2. IRPS 2019: 1-4

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