"Use of High Voltage OBIRCH Fault Isolation Technique in Failure Analysis ..."

Chenran Lei et al. (2019)

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DOI: 10.1109/IRPS.2019.8720487

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Chenran Lei, Albert Lee, Qinkan Kang, MinKwang Lee, Seiji Yang, Dan Oliver, Tu Giao:
Use of High Voltage OBIRCH Fault Isolation Technique in Failure Analysis of High Voltage IC's. IRPS 2019: 1-4

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