"Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices."

Soonyoung Lee et al. (2015)

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DOI: 10.1109/IRPS.2015.7112728

access: closed

type: Conference or Workshop Paper

metadata version: 2024-03-04

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Soonyoung Lee, Ilgon Kim, Sungmock Ha, Cheong-sik Yu, Jinhyun Noh, Sangwoo Pae, Jongwoo Park:
Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices. IRPS 2015: 4

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