"Design Insights to Address Low Current ESD Failure and Power Scalability ..."

Nagothu Karmel Kranthi et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129624

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava:
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. IRPS 2020: 1-5

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