"The Characterization of Degradation on various SiON pMOSFET transistors ..."

Gang-Jun Kim et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405108

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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Gang-Jun Kim, Moonjee Yoon, SungHwan Kim, Myeongkyu Eo, Shinhyung Kim, Taehun You, Namhyun Lee, Kijin Kim, Sangwoo Pae:
The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress. IRPS 2021: 1-4

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