"Investigation of the data retention mechanism and modeling for the high ..."

Yoshiyuki Kawashima, Takashi Hashimoto, Ichiro Yamakawa (2015)

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DOI: 10.1109/IRPS.2015.7112809

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Yoshiyuki Kawashima, Takashi Hashimoto, Ichiro Yamakawa:
Investigation of the data retention mechanism and modeling for the high reliability embedded split-gate MONOS flash memory. IRPS 2015: 6

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