"A Statistical Learning Model for Accurate Prediction of Time-Dependent ..."

Kaustubh Joshi et al. (2019)

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DOI: 10.1109/IRPS.2019.8720424

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-15

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Kaustubh Joshi, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen:
A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. IRPS 2019: 1-6

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