"Alternating Temperature Stress and Deduction of Effective Stress Levels ..."

Alexander Hirler et al. (2019)

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DOI: 10.1109/IRPS.2019.8720536

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-28

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Alexander Hirler, Adnan Alsioufy, Josef Biba, T. Lehndorff, D. Lipp, Helmut Lochner, Mahesh Siddabathula, S. Simon, Torsten Sulima, Maciej Wiatr, Walter Hansch:
Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability. IRPS 2019: 1-4

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