"The electromigration behavior of copper pillars for different current ..."

Christine S. Hau-Riege et al. (2015)

> Home

Details and statistics

DOI: 10.1109/IRPS.2015.7112750

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/Hau-RiegeYCKSBS15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/Hau-RiegeYCKSBS15
Christine S. Hau-Riege, You-Wen Yau, Kevin Caffey, Rajneesh Kumar, YangYang Sun, Andy Bao, Milind Shah, Lily Zhao, Omar Bchir, Ahmer Syed, Steve Bezuk:
The electromigration behavior of copper pillars for different current directions and pillar shapes. IRPS 2015: 5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.