"GIDL Increase Due to HCI Stress: Correlation Study of MOSFET Degradation ..."

Edoardo Ceccarelli et al. (2019)

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DOI: 10.1109/IRPS.2019.8720590

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Edoardo Ceccarelli, Kevin Manning, Seamus Maxwell, Colm Heffernan:
GIDL Increase Due to HCI Stress: Correlation Study of MOSFET Degradation Parameters and Modelling for Reliability Simulation. IRPS 2019: 1-5

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