"Data retention statistics and modelling in HfO2 resistive switching memories."

Stefano Ambrogio et al. (2015)

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DOI: 10.1109/IRPS.2015.7112810

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Stefano Ambrogio, Simone Balatti, Zhongqiang Wang, Yu-Sheng Chen, Heng-Yuan Lee, Frederick T. Chen, Daniele Ielmini:
Data retention statistics and modelling in HfO2 resistive switching memories. IRPS 2015: 7

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