"Time Dependent Variability in Advanced FinFET Technology for ..."

Hai Jiang et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405129

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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  dblp key:
  - conf/irps/0005KCSSPRL21
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  - https://dblp.org/rec/conf/irps/0005KCSSPRL21
Hai Jiang, Jinju Kim, Kihyun Choi, Hyewon Shim, Hyunchul Sagong, Junekyun Park, Hwasung Rhee, Euncheol Lee:
Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction. IRPS 2021: 1-6

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