"Scenario-based test case generation for state-based embedded systems."

Wei-Tek Tsai et al. (2003)

> Home

Details and statistics

DOI: 10.1109/PCCC.2003.1203716

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

- view
  authority control:
- export record
  dblp key:
  - conf/ipccc/TsaiYLSX03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ipccc/TsaiYLSX03
Wei-Tek Tsai, L. Yu, X. X. Liu, A. Saimi, Y. Xiao:
Scenario-based test case generation for state-based embedded systems. IPCCC 2003: 335-342

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.