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"Photomask Defect Extraction by Using Difference between a Reference Image ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Youngmin Ha, Hong Jeong (2007)

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DOI: 10.1109/IPC.2007.53

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/ipc/HaJ07
Youngmin Ha, Hong Jeong:
Photomask Defect Extraction by Using Difference between a Reference Image and a Test Image after Illumination Adjustment. IPC 2007: 242-248

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