"Hot-carrier and BTI damage distinction for high performance digital ..."

Alain Bravaix et al. (2016)

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DOI: 10.1109/IOLTS.2016.7604669

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type: Conference or Workshop Paper

metadata version: 2023-09-30

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Alain Bravaix, M. Saliva, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Edith Kussener, E. Pauly, Vincent Huard:
Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes. IOLTS 2016: 43-46

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