"From an analytic NBTI device model to reliability assessment of complex ..."

Nasim Pour Aryan et al. (2014)

> Home

Details and statistics

DOI: 10.1109/IOLTS.2014.6873666

access: closed

type: Conference or Workshop Paper

metadata version: 2017-07-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iolts/AryanLHYGS14
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iolts/AryanLHYGS14
Nasim Pour Aryan, A. Listl, Leonhard Heiß, Cenk Yilmaz, Georg Georgakos, Doris Schmitt-Landsiedel:
From an analytic NBTI device model to reliability assessment of complex digital circuits. IOLTS 2014: 19-24

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.