"Lightweight Probabilistic Coverage Metrics for Efficient Testing of Deep ..."

Yining Yin et al. (2025)

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DOI: 10.1145/3755881.3755915

access: closed

type: Conference or Workshop Paper

metadata version: 2026-03-05

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Yining Yin, Yang Feng, Shihao Weng, Xinyu Gao, Jia Liu, Zhihong Zhao:
Lightweight Probabilistic Coverage Metrics for Efficient Testing of Deep Neural Networks. Internetware 2025: 474-486

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