"DML Mask R-CNN: addressing Dependent Multi-Label defect detection with ..."

Thomas Mignot et al. (2025)

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DOI: 10.1109/IJCNN64981.2025.11228587

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type: Conference or Workshop Paper

metadata version: 2025-11-21

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Thomas Mignot, François Ponchon, Alexandre Derville, Stefan Duffner, Christophe Garcia:
DML Mask R-CNN: addressing Dependent Multi-Label defect detection with severity estimation in manufacturing. IJCNN 2025: 1-8

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