"Nano-technology aware investigations on fault-masking techniques in the ..."

Matthias Sand, Volkmar Sieh, Dietmar Fey (2010)

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DOI: 10.1109/HPCS.2010.5547139

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Matthias Sand, Volkmar Sieh, Dietmar Fey:
Nano-technology aware investigations on fault-masking techniques in the presence of high fault probabilities. HPCS 2010: 181-187

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